Third generation
Semiconductor Testing
family
Third generation semiconductor testing family
MENU
QT-3102 thermal resistance tester
QT-3102-XX test device type: triode, field effect tube, IGBT, diode
|
Support double DIE |
1000W thermal resistance |
Overload and undervoltage protection |
|
| Type | QT-3102 |
| Advantages |
QT-3102-XX test device type: triode, field effect tube, IGBT, diode R26: Can be built into the DC test item of QT-4100 to achieve high-power built-in thermal resistance testing R26：Dual Die testing can be implemented through scanbox |
| Main Features |
? The maximum current and maximum voltage depend on the model. The maximum current is 20A and 50A respectively. ? The maximum voltages are 100V and 200V respectively |
Testing standards
|
No. 16 Guangming Avenue, New Light Source Industry Base, Nanhai National High tech Zone, Foshan City, Guangdong Province, China |
|
+86 757 83207313 (Sales) |
|
+86 757 83208786 (Sales) |
|
info@powertechsemi.com |
Copyright PowerTECH industrial Co., Ltd. Powertechsmemi.com ? 2015 | Privacy policy | Sitmap 粵ICP備17127080號(hào)-1
