Third generation
Semiconductor Testing
family
Third generation semiconductor testing family
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KGD (Know Good Die) testing solution
Sustain high temperature and normal temperature testing: DC+SW+UIL+RG&QA; Provide test machine + turret/translation sorting machine matching solution; Provide short circuit protection + self-developed probe
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Pin card
protection |
Two-DUT test in parallel |
High temperature and normal temperature |
Data merge |
| Model | KGD testing solutions |
| Product Advantages |
Low stray solution Short circuit protection: short circuit shutdown time is less than 300nS Customized socket, adapt to different Handler solutions Special probe material, short circuit test does not melt or stick to foreign matter Support station merging Support test machine + turret solution, high test efficiency |
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No. 16 Guangming Avenue, New Light Source Industry Base, Nanhai National High tech Zone, Foshan City, Guangdong Province, China |
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+86 757 83207313 (Sales) |
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+86 757 83208786 (Sales) |
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info@powertechsemi.com |
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