第三代
半導(dǎo)體測(cè)試家族
Third generation semiconductor testing family
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QT-8600RF Mixed Signal RF Test System
RF6G/12G test module, used for high power output, harmonic test, switching time, insertion loss, isolation, S11, Ron, Coff, same-end loop, IP3, and spurious test.
Suspended power supply |
Multiple sites in parallel |
Multi-channel high precision |
Supports multiple extensions |
Model | QT-8600RF Mixed Signal RF Test System |
Product Advantages | RF6G test module, used for high power output, harmonic test, switching time, insertion loss, isolation, S11, Ron, Coff, same-end loop, IP3, spurious test |
Key Features |
? 6GHz/12GHz RF measurement, digital meets tests MIPI 100MHz or within ? Supports vector scalar test, DC, digital, RF integrated machine ? Power up to 9GHz & 35dBm, supports 2-station RF parallel test, multi-station composite test ? Self-developed algorithm communication, UPH up to 12K/H ? Provides efficient test platform for RF switches, LNA, TUNER, filters and other devices |
Recommend推薦產(chǎn)品
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中國(guó)廣東省佛山市南海國(guó)家高新區(qū)新光源產(chǎn)業(yè)基地光明大道16號(hào) |
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0757 83207313 (銷售) |
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0757 83208786 (銷售) |
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