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QT-6000 Discrete Device High-Speed Test System

QT-6000 discrete device high-speed tester, suitable for testing small and medium power diodes, transistors, MOS and other products. It can expand built-in capacitance (DC+CAP), EAS, Vc, pA modules, and can also expand external LCR (ultra-high precision capacitance test), Scanbox, etc., applied for wafer, FT mass production or laboratory testing.



Suspended power supply

Four quadrant circuit

High speed test

Supports multiple extensions

Type
 QT-6000
Advantages ? QT-6000 discrete device high-speed testing machine has the performance advantages of high testing accuracy, fast testing speed, good stability, high reliability and strong anti-interference ability.
? Adopting four-quadrant circuit, the device under test can be protected very well.
? Adopting suspended power supply and fully symmetrical structure.
? High-speed testing meets the requirements of handler above UPH56K.
Main Features ? High speed test, UPH>40K
? One-to-two can achieve 100% FT+QA parallel testing
? Advanced capacitor high-speed test solution to achieve CAP+DC same-station testing
? Built-in UIS test solution to achieve DC+UIS same-station testing

? LCR precision capacitance test, the minimum test capacitance value is 100fF

? Voltage/current (optional): 1200V/600V, 30A/10A/3A.





Testing standards檢測標準

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