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第三代
半導(dǎo)體測(cè)試家族
Third generation semiconductor testing family
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QT-3101 UIL avalanche test

QT-3101 UIL avalanche test is suitable for testing avalanche parameters of MOSFETs, IGBTs and diodes



Support double DIE

Fast charging

Save failure waveform

Clamp voltage function

Type QT-3101 UIL
Advantages Support VDD ON(E=1/2L*I*I*BVDSS/(BVDSS-VDD)) or VDD OFF(E=1/2*L*I*I) test
Can share a computer with QT-4100B to achieve unified management of test programs and data
Single pulse, multi-pulse or dual MOSFET testing can be set
Real-time measurement monitors, output current, IDMAX, and Energy readouts
The internal resistance of the inductor is low, the ID charging is fast, and the test time is shorter
Built-in oscilloscope
Main Features

Support RPF
Wafer test burst protection
Visual of  actual measured energy (mJ)
Support PVDROOP, PVCOLLAPSE test
QT-UILM module: ID current output capacity increased to 400A, BVDSS voltage measurement 5K


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