国产啪,日本一二区女同高清,天天搞天天日天天搞,免费亚州熟女

搜索

語言

第三代

半導(dǎo)體測試家族

Third generation semiconductor testing family

首頁產(chǎn)品中心 Test System Power Device Testing System

分類

KGD (Know Good Die) testing solution

Sustain high temperature and normal temperature testing: DC+SW+UIL+RG&QA; Provide test machine + turret/translation sorting machine matching solution; Provide short circuit protection + self-developed probe

Pin card

protection

Two-DUT test in parallel

High temperature and

normal temperature

Data merge

Model	KGD testing solutions
Product Advantages	Low stray solution Short circuit protection: short circuit shutdown time is less than 300nS Customized socket, adapt to different Handler solutions Special probe material, short circuit test does not melt or stick to foreign matter Support station merging
	Support test machine + turret solution, high test efficiency

Recommend推薦產(chǎn)品